Both methods collect particles or electromagnetic waves, and in both methods it's possible to reconstruct a 2D image, which may represent morphology (AFM, LEED for example), electronic structure (STM, EFM for example), magnetic structure (MFM, XPEEM for example) etc.
But is there a reason (other than historic) to divide materials analysis methods between microscopy and spectroscopy?
(Related question: What's the difference between "spectromicroscopy" and "microspectroscopy"?)
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